Piezoelectric anti-stiction structure for microelectromechanical systems

ABSTRACT

Various embodiments of the present disclosure are directed towards a microelectromechanical system (MEMS) device. The MEMS device includes a first dielectric structure disposed over a first semiconductor substrate, where the first dielectric structure at least partially defines a cavity. A second semiconductor substrate is disposed over the first dielectric structure and includes a movable mass, where opposite sidewalls of the movable mass are disposed between opposite sidewall of the cavity. A first piezoelectric anti-stiction structure is disposed between the movable mass and the first dielectric structure, wherein the first piezoelectric anti-stiction structure includes a first piezoelectric structure and a first electrode disposed between the first piezoelectric structure and the first dielectric structure

REFERENCE TO RELATED APPLICATION

This application is a Divisional of U.S. application Ser. No.16/558,539, filed on Sep. 3, 2019, the contents of which are herebyincorporated by reference in their entirety.

BACKGROUND

Microelectromechanical systems (MEMS) devices are microscopic devicesthat integrate mechanical and electrical components to sense physicalquantities and/or to act upon surrounding environments. In recent years,MEMS devices have become increasingly common. For example, the use ofMEMS devices as sensing devices (e.g., motion sensing devices, pressuresensing devices, acceleration sensing devices, etc.) has becomewidespread in many of today's personal electronics (e.g., smart phones,fitness electronics, personal computing devices). MEMS devices are alsoused in other applications, such as vehicle applications (e.g., foraccident detection and airbag deployment systems), aerospaceapplications (e.g., for guidance systems), medical applications (e.g.,for patient monitoring), etc.

BRIEF DESCRIPTION OF THE DRAWINGS

Aspects of the present disclosure are best understood from the followingdetailed description when read with the accompanying figures. It isnoted that, in accordance with the standard practice in the industry,various features are not drawn to scale. In fact, the dimensions of thevarious features may be arbitrarily increased or reduced for clarity ofdiscussion.

FIG. 1 illustrates a cross-sectional view of some embodiments of amicroelectromechanical system (MEMS) device comprising a piezoelectricanti-stiction structure.

FIG. 2 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 3 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 4 illustrates a cross-sectional view of some other embodiments ofthe MEMS device of FIG. 1.

FIG. 5 illustrates a cross-sectional view of some more detailedembodiments of the MEMS device of FIG. 1.

FIG. 6 illustrates a view of some embodiments of a system comprisingsome embodiments of the MEMS device of FIG. 1.

FIGS. 7-22 illustrate a series of cross-sectional views of someembodiments for forming the MEMS device of FIG. 5.

FIG. 23 illustrates a flowchart of some embodiments of a method forforming a MEMS device comprising a piezoelectric anti-stictionstructure.

DETAILED DESCRIPTION

The following disclosure provides many different embodiments, orexamples, for implementing different features of the provided subjectmatter. Specific examples of components and arrangements are describedbelow to simplify the present disclosure. These are, of course, merelyexamples and are not intended to be limiting. For example, the formationof a first feature over or on a second feature in the description thatfollows may include embodiments in which the first and second featuresare formed in direct contact, and may also include embodiments in whichadditional features may be formed between the first and second features,such that the first and second features may not be in direct contact. Inaddition, the present disclosure may repeat reference numerals and/orletters in the various examples. This repetition is for the purpose ofsimplicity and clarity and does not in itself dictate a relationshipbetween the various embodiments and/or configurations discussed.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly.

Many MEMS devices (e.g., accelerometers, gyroscopes, etc.) comprise amovable mass and a fixed electrode plate. The movable mass has a planarsurface aligned in parallel and spaced apart from an opposed planarsurface of the fixed electrode plate. In response to external stimuli(e.g., pressure, acceleration, gravity, etc.), the movable mass isdisplaced inside a cavity. This displacement changes a distance betweenthe movable mass and the fixed electrode plate. The change in distancemay be detected by a change in capacitive coupling between the movablemass and the fixed electrode and analyzed by appropriate electricalcircuits to derive a measurement of a physical quantity associated withthe change in distance, such as acceleration.

One of the design challenges with MEMS devices is to prevent the movablemass from sticking to adjacent parts of the MEMS device, an effect knownas stiction. As the scale of these devices continues to shrink, andspacing between adjacent surfaces becomes smaller, prevention ofunintended stiction becomes an increasingly important designconsideration. Stiction can occur under a number of conditions. Duringmanufacturing, stiction can occur when, for example, the movable mass isnot fully released from its neighboring surface. Stiction can also occurduring normal operation when the movable mass deflects to a point inwhich the movable mass comes into contact with neighboring parts (e.g.,surface of a cavity, surface of a stopper/bump, etc.).

Various embodiments of the present application are directed toward aMEMS device having a piezoelectric anti-stiction structure. The MEMSdevice includes an interlayer dielectric (ILD) structure that isdisposed over a first semiconductor substrate. An upper surface of theILD structure at least partially defines a bottom of a cavity. A secondsemiconductor substrate is disposed over the ILD structure and comprisesa movable mass. In response to external stimuli, the movable mass isconfigured to be displaced within the cavity. The piezoelectricanti-stiction structure comprises a piezoelectric structure and anelectrode. Further, the piezoelectric anti-stiction structure isdisposed between the moveable mass and the upper surface of the ILDstructure. Because the piezoelectric anti-stiction structure is disposedbetween the moveable mass and the upper surface of the ILD structure,the piezoelectric anti-stiction structure may prevent/correct stiction.

For example, if the movable mass deflects beyond a given point towardsthe bottom of the cavity, the piezoelectric anti-stiction structure willprevent the movable mass from contacting the bottom of the cavity andpotentially sticking to the upper surface of the ILD structure. Thus, ifthe movable mass were to stick to a neighboring part, the movable masswould stick to the piezoelectric anti-stiction structure. If the movablemass becomes stuck to the piezoelectric anti-stiction structure, avoltage can be applied to the electrode that is sufficient to cause thepiezoelectric structure to deform (or vibrate), thereby generating amechanical force that may release the movable mass from its stuck stateon the piezoelectric anti-stiction structure.

Another example of the piezoelectric anti-stiction structurepreventing/correcting stiction may comprise the movable mass having afirst doping type. In such embodiments, a first voltage is applied tothe electrode, and a second voltage is applied to the movable mass.Thus, a voltage across the piezoelectric structure will differ based ona distance the movable mass is from the electrode. Accordingly, if themovable mass deflects beyond a given point towards the bottom of thecavity (e.g., contacting the piezoelectric anti-stiction structure), thedistance between the movable mass and the electrode will cause thevoltage across the piezoelectric anti-stiction structure to besufficient to cause the piezoelectric structure to deform, therebygenerating a mechanical force that may release the movable mass from itsstuck state on the piezoelectric anti-stiction structure.

FIG. 1 illustrates a cross-sectional view of some embodiments of amicroelectromechanical system (MEMS) device 100 comprising apiezoelectric anti-stiction structure. The MEMS device 100 may be, forexample, an accelerometer, a gyroscope, or some other MEMS device.

As shown in FIG. 1, the MEMS device 100 comprises a first semiconductorsubstrate 102. The first semiconductor substrate 102 may comprise anytype of semiconductor body (e.g., monocrystalline silicon/CMOS bulk,silicon-germanium (SiGe), silicon on insulator (SOI), etc.). In someembodiments, one or more semiconductor devices 104 may be disposed on/inthe first semiconductor substrate 102. In further embodiments, thesemiconductor devices 104 may be or comprise, for example,metal-oxide-semiconductor (MOS) field-effect transistors (FETs), someother MOS devices, or some other semiconductor devices. In yet furtherembodiments, the first semiconductor substrate 102 may be referred to asa complementary metal-oxide-semiconductor (CMOS) substrate.

An interlayer dielectric (ILD) structure 106 is disposed over the firstsemiconductor substrate 102 and the semiconductor devices 104. Aninterconnect structure 108 (e.g., copper interconnect) is embedded inthe ILD structure 106. The interconnect structure 108 comprises aplurality of conductive features (e.g., metal lines, metal vias, metalcontacts, etc.). In some embodiments, the ILD structure 106 comprisesone or more stacked ILD layers, which may respectively comprise a low-kdielectric (e.g., a dielectric material with a dielectric constant lessthan about 3.9), an oxide (e.g., SiO₂), or the like. In furtherembodiments, the ILD structure 106 comprises a lower ILD structure 110and an upper ILD structure 112 disposed over the lower ILD structure110. In yet further embodiments, the plurality of conductive featuresmay comprise, for example, copper (Cu), aluminum (Al), tungsten (W),titanium nitride (TiN), aluminum-copper (AlCu), some other conductivematerial, or a combination of the foregoing.

A second semiconductor substrate 114 is disposed over both the ILDstructure 106 and the first semiconductor substrate 102. The secondsemiconductor substrate 114 may comprise any type of semiconductor body(e.g., monocrystalline silicon/CMOS bulk, SiGe, SOI, etc.). In someembodiments, the second semiconductor substrate 114 may have a firstdoping type (e.g., p-type/n-type). In further embodiments, the secondsemiconductor substrate 114 may be referred to as a MEMS substrate. Infurther embodiments, a third semiconductor substrate 116 is disposedover both the second semiconductor substrate 114 and the firstsemiconductor substrate 102. The third semiconductor substrate 116 maycomprise any type of semiconductor body (e.g., monocrystallinesilicon/CMOS bulk, SiGe, SOI, etc.). In yet further embodiments, thethird semiconductor substrate 116 may be referred to as a cap substrate.

The ILD structure 106 at least partially defines a cavity 118. In someembodiments, the upper ILD structure 112, the interconnect structure108, the second semiconductor substrate 114, and the third semiconductorsubstrate 116 define the cavity 118. In further embodiments, an upperconductive line 120 of the interconnect structure 108 may at leastpartially define the cavity 118. For example, the upper conductive line120 and an upper surface of the upper ILD structure 112 may define abottom surface of the cavity 118, and a bottom surface of the thirdsemiconductor substrate 116 may define an upper surface of the cavity118. In further embodiments, the upper conductive line 120 of theinterconnect structure 108 may be the uppermost conductive line (e.g.,uppermost metal line) of the interconnect structure 108. In yet furtherembodiments, the third semiconductor substrate 116 at least partiallydefines an upper portion of the cavity 118, and the upper ILD structure112 at least partially defines a lower portion of the cavity 118.

The second semiconductor substrate 114 comprises a movable mass 122(e.g., proof mass). The movable mass 122 is a portion of the secondsemiconductor substrate 114 that is suspended in the cavity 118 by oneor more tethers (not shown). In some embodiments, the movable mass 122has the first doping type (e.g., p-type) or a second doping type (e.g.,n-type) opposite the first doping type. In further embodiments, themovable mass 122 may have a first doping concentration of first dopingtype dopants (e.g., p-type dopants) that is greater than or equal toabout 1×10²⁰ cm³, or a second doping concentration of second doping typedopants (e.g., n-type dopants) that is greater than or equal to about1×10²⁰ cm⁻³. In yet further embodiments, opposite sidewalls of themovable mass 122 are disposed between opposite sidewall of the upper ILDstructure 112.

A plurality of piezoelectric anti-stiction structures 124 are disposedin the cavity 118. For example, a first piezoelectric anti-stictionstructure 124 a and a second piezoelectric anti-stiction structure 124 bare disposed in the cavity 118 and spaced apart. In some embodiments,the piezoelectric anti-stiction structures 124 are disposed between anupper surface of the upper ILD structure 112 and the movable mass 122.It will be appreciated that, in some embodiments, only a singlepiezoelectric anti-stiction structure may be disposed in the cavity 118.

For clarity, features of the piezoelectric anti-stiction structures 124may be described in reference to only one of the piezoelectricanti-stiction structures 124 (e.g., the first piezoelectricanti-stiction structure 124 a), and it will be appreciated that each ofthe plurality of piezoelectric anti-stiction structures 124 may alsocomprise such features. For example, the first piezoelectricanti-stiction structure 124 a comprises a first electrode 126 a.Therefore, it will be appreciated that the second piezoelectricanti-stiction structure 124 b may comprise a second electrode 126 b (andany other piezoelectric anti-stiction structure may also comprise anelectrode).

The first piezoelectric anti-stiction structure 124 a comprises a firstpiezoelectric structure 128 a disposed on the first electrode 126 a. Insome embodiments, a first conductive structure 130 a is disposed on thefirst piezoelectric structure 128 a. In further embodiments, the firstelectrode 126 a is electrically coupled to one or more of thesemiconductor devices 104 via the interconnect structure 108. In furtherembodiments, the first electrode 126 a is electrically coupled to theupper conductive line 120.

The first electrode 126 a may comprise, for example, platinum (Pt),titanium (Ti), copper (Cu), gold (Au), aluminum (Al), zinc (Zn), tin(Sn), some other conductive material, or a combination of the foregoing.In some embodiments, the first piezoelectric structure 128 a maycomprise, for example, lead zirconate titanate (PZT), zinc oxide (ZnO),barium titanate (BaTiO₃), potassium niobate (KNbO₃),sodium-tungsten-oxide (Na₂WO₃), barium-sodium-niobium-oxide(Ba₂NaNb₅O₅), lead-potassium-niobium-oxide (Pb₂KNb₅O₁₅), langasite(La₃Ga₅SiO₁₄), gallium phosphate (GaPO₄), lithium-niobium-oxide(LiNbO₃), lithium tantalate (LiTaO₃), some other piezoelectric material,or a combination of the foregoing. The first conductive structure 130 amay comprise, for example, Pt, Ti, Cu, Au, Al, Zn, Sn, some otherconductive material, or a combination of the foregoing. In someembodiments, the first electrode 126 a and the first conductivestructure 130 a comprise a same material (e.g., Pt). In otherembodiments, the first electrode 126 a may comprise a different materialthan the first conductive structure 130 a. In further embodiments, theupper conductive line 120 may be a multi-layered structure comprising afirst layer (e.g., TiN), a second layer (e.g., AlCu) disposed over andon the first layer, and a third layer (e.g., TiN) disposed over and onthe second layer.

The first electrode 126 a is configured to receive a first voltage. Insome embodiments, the first voltage is less than or equal to about 25volts (V). More specifically, the first voltage may be between about 15V and about 25 V. In some embodiments, the first conductive structure130 a is configured to be electrically floating (e.g., having a floatingvoltage). In other embodiments, the first conductive structure 130 a isconfigured to receive a second voltage. In some embodiments, the secondvoltage may be less than or equal to about 5 V. In yet furtherembodiments, the movable mass 122 is configured to receive a thirdvoltage. The third voltage may be less than or equal to about 5 V.

Because the piezoelectric anti-stiction structures 124 are disposedbetween the upper ILD structure 112 and the movable mass 122, thepiezoelectric anti-stiction structures 124 may prevent/correct stiction.For example, if the movable mass 122 becomes stuck to the firstpiezoelectric anti-stiction structure 124 a, the first voltage can beprovided to the first electrode 126 a. By providing the first voltage tothe first electrode 126 a, the first piezoelectric structure 128 a maydeform (or vibrate) from a first shape to a second shape different thanthe first shape due to a voltage across the first piezoelectricstructure 128 a, thereby generating a mechanical force that may besufficient to correct (or prevent) a seized state (e.g., the movablemass 122 being stuck to the first piezoelectric anti-stiction structure124 a).

FIG. 2 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 2, the piezoelectric anti-stiction structures 124 maycomprise dielectric structures 202 disposed on the piezoelectricstructures 128, respectively. For example, the first piezoelectricanti-stiction structure 124 a may comprise a first dielectric structure202 a disposed on the first piezoelectric structure 128 a, and thesecond piezoelectric anti-stiction structure 124 b may comprise a seconddielectric structure 202 b disposed on a second piezoelectric structure128 b. The first dielectric structure 202 a is separated from the upperILD structure 112 by both the first piezoelectric structure 128 a andthe first electrode 126 a. In some embodiments, the first dielectricstructure 202 a may comprise, for example, an oxide (e.g., SiO₂), anitride (e.g., silicon nitride (SiN)), an oxy-nitride (e.g., siliconoxy-nitride (SiO_(X)N_(Y))), some other dielectric material, or acombination of the foregoing.

In embodiments in which the piezoelectric anti-stiction structures 124comprise the dielectric structures 202, respectively, the movable mass122 may have the first doping type and have the first dopingconcentration or have the second doping type and have the second dopingconcentration. In such embodiments, the piezoelectric anti-stictionstructures 124 may prevent/correct stiction by providing the thirdvoltage to the movable mass 122 and applying the first voltage to thefirst electrode 126 a. In some embodiments, the third voltage and thefirst voltage may be applied whether the movable mass 122 is in a seizedstate (e.g., unable to freely move) or in movable state (e.g., normaloperating state). By providing the first voltage to the first electrode126 a and the third voltage to the movable mass 122, a voltage acrossthe first piezoelectric structure 128 a will differ based on a distancein which the movable mass 122 is from the first electrode 126 a.Accordingly, if the movable mass 122 deflects beyond a given pointtowards the first piezoelectric anti-stiction structure 124 a (e.g.,contacts/sticks to the first dielectric structure 202 a), the voltageacross the first piezoelectric structure 128 a may be sufficient tocause the first piezoelectric structure 128 a to deform, therebygenerating a mechanical force that may be sufficient to correct (orprevent) a seized state. In further embodiments, the first dopingconcentration and/or the second doping concentration may be such thatthe voltage across the first piezoelectric structure 128 a is notsufficient to deform the first piezoelectric structure 128 a unless themovable mass 122 contacts/sticks to the first dielectric structure 202a.

FIG. 3 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 3, the piezoelectric anti-stiction structures 124 maybe disposed between the movable mass 122 and the third semiconductorsubstrate 116. For example, a third piezoelectric anti-stictionstructure 124 c and a fourth piezoelectric anti-stiction structure 124 dare disposed in the cavity 118 and between the movable mass 122 and abottom surface of the third semiconductor substrate 116. Because thethird piezoelectric anti-stiction structure 124 c is disposed betweenthe movable mass 122 and the third semiconductor substrate 116, thethird piezoelectric anti-stiction structure 124 c may prevent/correctstiction in which the movable mass 122 is stuck to a surface disposedabove the movable mass 122 (e.g., the bottom surface of the thirdsemiconductor substrate 116). In some embodiments, the piezoelectricanti-stiction structures 124 disposed between the movable mass 122 andthe third semiconductor substrate 116 may be referred to aspiezoelectric anti-stiction stoppers. In further embodiments, thepiezoelectric anti-stiction structures 124 disposed between the movablemass 122 and the upper ILD structure 112 may be referred to aspiezoelectric anti-stiction bumps.

In some embodiments, the third piezoelectric anti-stiction structure 124c comprises a third dielectric structure 202 c disposed on a thirdpiezoelectric structure 128 c. The third dielectric structure 202 cseparates both the third piezoelectric structure 128 c and a thirdelectrode 126 c from the movable mass 122. In further embodiments, thethird electrode 126 c may contact both the third semiconductor substrate116 and the third piezoelectric structure 128 c.

In some embodiments, the piezoelectric anti-stiction structures 124disposed above the movable mass 122 may be aligned in a verticaldirection with the piezoelectric anti-stiction structures 124 disposedbelow the movable mass 122, respectively. For example, the thirdpiezoelectric anti-stiction structure 124 c may be vertically alignedwith the first piezoelectric anti-stiction structure 124 a. In otherembodiments, the piezoelectric anti-stiction structures 124 disposedabove the movable mass 122 may not be aligned with the piezoelectricanti-stiction structures 124 disposed below the movable mass 122,respectively. For example, the third piezoelectric anti-stictionstructure 124 c may be spaced a first lateral distance from a sidewallof the upper ILD structure 112, and the first piezoelectricanti-stiction structure 124 a may be spaced a second lateral distancefrom the sidewall of the upper ILD structure 112 different than thefirst lateral distance.

FIG. 4 illustrates a cross-sectional view of some other embodiments ofthe MEMS device 100 of FIG. 1.

As shown in FIG. 4, some of the piezoelectric anti-stiction structures124 may comprise the dielectric structures 202 and some other of thepiezoelectric anti-stiction structures 124 may comprise the conductivestructures 130. For example, the first piezoelectric anti-stictionstructure 124 a may comprise the first conductive structure 130 a, andthe third piezoelectric anti-stiction structure 124 c may comprise thethird dielectric structure 202 c.

In some embodiments, a layout of the first piezoelectric anti-stictionstructure 124 a may be generally square shaped, rectangular shaped, orthe like. In some embodiments, sidewalls of the first piezoelectricanti-stiction structure 124 a may be substantially vertical. In otherembodiments, the sidewalls of the first piezoelectric anti-stictionstructure 124 a may be angled (e.g., angled inward as they extend fromthe upper surface of the upper ILD structure 112). In furtherembodiments, sidewalls of the first electrode 126 a may be substantiallyaligned with sidewalls of the first piezoelectric structure 128 a. Thesidewalls of the first piezoelectric structure 128 a may besubstantially aligned with sidewalls of the first conductive structure130 a. In yet further embodiments, sidewalls of the third piezoelectricstructure 128 c may be substantially aligned with sidewalls of the thirddielectric structure 202 c.

The upper surface of the upper ILD structure 112 (e.g., bottom of thecavity 118) is vertically spaced from an uppermost surface of the upperILD structure 112 by a first distance D₁. The first piezoelectricanti-stiction structure 124 a has a first height H₁. In someembodiments, the first height H₁ is between about 30 percent and about50 percent of the first distance D₁. In further embodiments, the firstdistance D₁ is less than or equal to about 3 micrometers (um). Morespecifically, the first distance D₁ may be between about 2 um and 3 um.In yet further embodiments, the first height H₁ is less than or equal toabout 1.5 um. More specifically, the first height H₁ is about 1 um.

The bottom surface of the third semiconductor substrate 116 (e.g., topof the cavity 118) is vertically spaced from a bottommost surface of thethird semiconductor substrate 116 by a second distance D₂. The thirdpiezoelectric anti-stiction structure 124 c has a second height H₂. Insome embodiments, the second height H₂ is between about 30 percent andabout 50 percent of the second distance D₂. The second distance D₂ maybe less than or equal to about 3 um. More specifically, the seconddistance D₂ may be between about 2 um and 3 um. The second height H₂ maybe less than or equal to about 1.5 um. More specifically, the secondheight H₂ may be about 1 um.

In some embodiments, the first height H₁ may be substantially the sameas the second height H₂. In other embodiments, the first height H₁ maybe different than the second height H₂. In further embodiments, thefirst distance D₁ may be substantially the same as the second distanceD₂. In other embodiments, the first distance D₁ may be different thanthe second distance D₂.

In some embodiments, a length (and/or width) of each the piezoelectricanti-stiction structures 124 may be substantially the same. In otherembodiments, the length (and/or width) of some of the piezoelectricanti-stiction structures 124 may be different than the length (and/orwidth) of some other of the piezoelectric anti-stiction structures 124.In further embodiments, a length of the first piezoelectricanti-stiction structure 124 a may be between about 15 percent and about50 percent of the first distance D₁. More specifically, the length ofthe first piezoelectric anti-stiction structure 124 a may be betweenabout 0.5 um and about 1 um. In yet further embodiments, a width of thefirst piezoelectric anti-stiction structure 124 a may be between about15 percent and about 50 percent of the first distance D₁. Morespecifically, the width of the first piezoelectric anti-stictionstructure 124 a may be between about 0.5 um and about 1 um.

In some embodiments, a length of the third piezoelectric anti-stictionstructure 124 c may be between about 15 percent and about 50 percent ofthe second distance D₂. More specifically, the length of the thirdpiezoelectric anti-stiction structure 124 c may be between about 0.5 umand about 1 um. In further embodiments, a width of the thirdpiezoelectric anti-stiction structure 124 c may be between about 15percent and about 50 percent of the second distance D₂. Morespecifically, the width of the third piezoelectric anti-stictionstructure 124 c may be between about 0.5 um and about 1 um.

FIG. 5 illustrates a cross-sectional view of some more detailedembodiments of the MEMS device 100 of FIG. 1.

As shown in FIG. 5, an upper conductive via 502 (e.g., a metal via) isdisposed in the upper ILD structure 112. In some embodiments, the upperconductive via 502 is disposed in the both the upper ILD structure 112and the lower ILD structure 110. The upper conductive via 502 iselectrically coupled to the interconnect structure 108 and the secondsemiconductor substrate 114. In further embodiments, the upperconductive via 502 may comprise, for example, Cu, Al, W, or the like.

A first conductive channel 504 is disposed in the second semiconductorsubstrate 114 and provides an electrical connection between the upperconductive via 502 and the movable mass 122. The first conductivechannel 504 is a portion of the second semiconductor substrate 114having the first doping type or the second doping type. In someembodiments, the third voltage may be applied to the movable mass 122via the interconnect structure 108, the upper conductive via 502, andthe first conductive channel 504. In further embodiments, the thirdvoltage may be applied to the movable mass 122 because the movable mass122 has a same doping type as the first conductive channel 504. Infurther embodiments, the first conductive channel 504 may extend from afixed portion of the second semiconductor substrate 114, along one ormore of the tethers (not shown), and to a region of the movable mass 122having the first doping type or the second doping type. In yet furtherembodiments, the first conductive channel 504 may be referred to as afirst doped region.

In some embodiments, the third semiconductor substrate 116 is bonded tothe second semiconductor substrate 114 via a bond structure 506 (e.g., aeutectic bond structure). The bond structure 506 may comprise an upperbond ring 508 disposed on a lower bond ring 510. In some embodiments,the bond structure 506 is electrically conductive. In furtherembodiments, the lower bond ring 510 may comprise, for example, Cu, Al,Au, Sn, Ti, some other bonding material, or a combination of theforegoing. In further embodiments, the upper bond ring 508 may comprise,for example, Cu, Al, Au, Sn, Ge, some other bonding material, or acombination of the foregoing. The upper bond ring 508 may have aring-shaped top layout that continuously extends around the movable mass122. In yet further embodiments, the lower bond ring 510 may have aring-shaped top layout that continuously extends around the movable mass122.

A through-substrate via (TSV) 512 is disposed in the secondsemiconductor substrate 114, the upper ILD structure 112, and the lowerILD structure 110. In some embodiments, the TSV 512 is disposed over thelower ILD structure 110. The TSV 512 extends completely through thesecond semiconductor substrate 114 to electrically couple theinterconnect structure 108 to the bond structure 506. In furtherembodiments, the TSV 512 extends through an isolation structure 514(e.g., shallow trench isolation (STI) structure) disposed in the secondsemiconductor substrate 114. In yet further embodiments, the TSV 512 maycomprise, for example, Cu, Al, W, or the like.

A second conductive channel 516 is disposed in the third semiconductorsubstrate 116 and provides an electrical connection between the bondstructure 506 and a fourth electrode 126 d. The second conductivechannel 516 is a portion of the third semiconductor substrate 116 havingthe first doping type or the second doping type. In some embodiments,the first voltage may be applied to the fourth electrode 126 d via theinterconnect structure 108, the TSV 512, the bond structure 506, and thesecond conductive channel 516. In further embodiments, the secondconductive channel 516 may be referred to as a second doped region.

A third conductive channel 518 is disposed in the third semiconductorsubstrate 116 and provides an electrical connection between the bondstructure 506 and the third electrode 126 c. The third conductivechannel 518 is a portion of the third semiconductor substrate 116 havingthe first doping type or the second doping type. In some embodiments,the first voltage may be applied to the third electrode 126 c via theinterconnect structure 108, the TSV 512 (or another TSV), the bondstructure 506, and the third conductive channel 518. In furtherembodiments, the third conductive channel 518 may be referred to as athird doped region.

FIG. 6 illustrates a view of some embodiments of a system 600 comprisingsome embodiments of the MEMS device 100 of FIG. 1.

As shown in FIG. 6, the system 600 comprises the MEMS device 100 andbias circuitry 602. The bias circuitry 602 is electrically coupled tothe MEMS device 100. The bias circuitry 602 is configured to provide oneor more bias signals 606 to the MEMS device 100 to prevent/correctstiction of the movable mass 122 of the MEMS device 100 (see, e.g., FIG.5). For example, the bias circuitry 602 may provide a first bias signal606 a having the first voltage to the electrodes 126 of thepiezoelectric anti-stiction structures 124, and the bias circuitry 602may provide a second bias signal 606 b having the third voltage to themovable mass 122.

In some embodiments, during operation of the MEMS device 100, the biascircuitry 602 may continuously provide the one or more bias signals 606to the MEMS device 100. In other embodiments, the bias circuitry 602 mayselectively provide the one or more bias signals 606 to the MEMS device100. In further embodiments, the bias circuitry 602 may selectivelyprovide the one or more bias signals 606 to the electrodes 126 of thepiezoelectric anti-stiction structures 124. For example, in someembodiments, the bias circuitry 602 may provide only the first biassignal 606 a to the first electrode 126 a.

In some embodiments, the system 600 comprises measurement circuitry 604that is electrically coupled to the MEMS device 100. In furtherembodiments, the measurement circuitry 604 is electrically coupled tothe bias circuitry 602. The measurement circuitry 604 is configured todetermine whether the MEMS device 100 is in a movable state (e.g., themovable mass 122 is free to move about the cavity 118) or in a seizedstate (e.g., the movable mass 122 is unable to move freely about thecavity 118). For example, the measurement circuitry 604 may provide oneor more analysis signals 608 to the MEMS device 100. The measurementcircuitry 604 receives one or more response signals 610 that correspondto the one or more analysis signals 608. For example, the measurementcircuitry 604 may provide a first analysis signal 608 a and a secondanalysis signal 608 b and receive a first response signal 610 a and asecond response signal 610 b, respectively. The measurement circuitryanalyzes the one or more response signals 610 to determine whether themovable mass 122 is in the movable state or the seized state (e.g.,analyzing voltages to determine the location of the movable mass 122 inthe cavity 118 in relation to one or more fixed electrodes).

The measurement circuitry 604 may determine the MEMS device 100 is in afirst seized state or a second seized state. The first seized state maybe referred to as a touch-down state and result when the movable mass122 contacts/sticks to the first piezoelectric anti-stiction structure124 a and the second piezoelectric anti-stiction structure 124 b. Thesecond seized state may be referred to a tilt state and result when themovable mass 122 contacts/sticks to the first piezoelectricanti-stiction structure 124 a but not the second piezoelectricanti-stiction structure 124 b, or vice versa. In some embodiments, themeasurement circuitry 604 may determine the movable mass 122 is in thefirst seized state when both the first response signal 610 a and thesecond response signal 610 b indicate the movable mass 122 is stuck toboth the first piezoelectric anti-stiction structure 124 a and thesecond piezoelectric anti-stiction structure 124 b. In furtherembodiments, the measurement circuitry 604 may determine the movablemass 122 is in the second seized state when the first response signal610 a indicates the movable mass 122 is stuck to the first piezoelectricanti-stiction structure 124 a, but the second response signal 610 bindicates the movable mass 122 is not stuck to the second piezoelectricanti-stiction structure 124 b.

In some embodiments, the measurement circuitry 604 may provide one ormore state indicating signals 612 that are based on the state of theMEMS device 100 to the bias circuitry 602. Based on the one or morestate indicating signals 612, the bias circuitry 602 may (or may not)provide the one or more bias signals 606 to the MEMS device 100. Forexample, the measurement circuitry 604 may provide one or more stateindicating signals 612 that indicate the MEMS device is in the movablestate, and the bias circuitry 602 may not provide any of the one or morebias signals 606 to the MEMS device 100. In other embodiments, duringoperation of the MEMS device 100, the bias circuitry 602 continuouslyprovides the one or more bias signals 606 to the MEMS device 100.

In some embodiments, the measurement circuitry 604 may provide a firststate indicating signal 612 a and a second state indicating signal 612 bto the bias circuitry 602 indicating the MEMS device 100 is in the firstseized state, and the bias circuitry 602 may provide the one or morebias signals 606 to the MEMS device 100. In such embodiments, the one ormore bias signals 606 may be provided to one or more of the electrodes126 of the piezoelectric anti-stiction structures 124. In otherembodiments, the measurement circuitry 604 may provide the first stateindicating signal 612 a and the second state indicating signal 612 b tothe bias circuitry 602 to indicate the MEMS device 100 is in the secondseized state. For example, the first state indicating signal 612 a mayindicate the movable mass 122 is stuck to the first piezoelectricanti-stiction structure 124 a, and the second state indicating signal612 b may indicate the movable mass 122 is not stuck to the secondpiezoelectric anti-stiction structure 124 b. In such embodiments, thebias circuitry 602 may provide a corresponding one or more bias signals606 to the MEMS device 100. For example, the bias circuitry 602 mayprovide the first bias signal 606 a to the first electrode 126 a todeform the first piezoelectric structure 128 a. In other suchembodiments, the bias circuitry 602 may provide the one or more biassignals 606 to the MEMS device 100. For example, the bias circuitry 602may provide the first bias signal 606 a to the first electrode 126 a todeform the first piezoelectric structure 128 a and the second biassignal 606 b to the second electrode 126 b to deform the secondpiezoelectric structure 128 b.

In some embodiments, an integrated chip (IC) comprises the system 600.In other embodiments, a first IC may comprise the MEMS device 100, and asecond IC different than the first IC may comprise the bias circuitry602 and/or the measurement circuitry 604. In yet other embodiments, thefirst IC may comprise the MEMS device 100, the second IC may comprisethe bias circuitry 602, and a third IC different than the first IC andthe second IC may comprise the measurement circuitry 604. In someembodiments, the bias circuitry 602 comprises one or more of the one ormore semiconductor devices 104 (see, e.g., FIG. 5). In furtherembodiments, the measurement circuitry 604 comprises one or more of theone or more semiconductor devices 104. In yet further embodiments, thebias circuitry 602 and the measurement circuitry 604 may be disposedon/over a same semiconductor substrate (e.g., the first semiconductorsubstrate 102).

FIGS. 7-22 illustrate a series of cross-sectional views of someembodiments for forming the MEMS device 100 of FIG. 5.

As shown in FIG. 7, a portion of an interconnect structure 108 isdisposed in a lower ILD structure 110 and over a first semiconductorsubstrate 102. Further, one or more semiconductor devices 104 aredisposed on/in the first semiconductor substrate 102. In someembodiments, a method for forming the structure illustrated in FIG. 7comprises forming the one or more semiconductor devices 104 by formingpairs of source/drain regions in the first semiconductor substrate 102(e.g., via ion implantation). Thereafter, gate dielectrics and gateelectrodes are formed over the first semiconductor substrate and betweenthe pairs of source/drain regions (e.g., via deposition/growth processesand etching processes). A first ILD layer is then formed over the one ormore semiconductor devices 104, and contact openings are formed in thefirst ILD. A conductive material (e.g., W) is formed on the first ILDlayer and in the contact openings. Thereafter, a planarization process(e.g., chemical-mechanical polishing (CMP)) is performed into theconductive material to form conductive contacts (e.g., metal contacts)in the first ILD layer.

A second ILD layer is then formed over the first ILD layer and theconductive contacts, and first conductive line trenches are formed inthe second ILD layer. A conductive material (e.g., Cu) is formed on thesecond ILD layer and in the first conductive line trenches. Thereafter,a planarization process (e.g., CMP) is performed into the conductivematerial to form a conductive line (e.g., metal 1) in the second ILD. Athird ILD layer is then formed over the second ILD layer and theconductive line, and conductive via openings are formed in the third ILDlayer. A conductive material (e.g., Cu) is formed on the third ILD layerand in the conductive via openings. Thereafter, a planarization process(e.g., (CMP) is performed into the conductive material to formconductive vias (e.g., metal vias) in the third ILD. The above processesfor forming the conductive line and the conductive vias may be repeatedany number of times. In some embodiments, the above layers and/orstructures may be formed using a deposition or growth process such as,for example, chemical vapor deposition (CVD), physical vapor deposition(PVD), atomic layer deposition (ALD), thermal oxidation, sputtering,electrochemical plating, electroless plating, some other deposition orgrowth process, or a combination of the foregoing.

As shown in FIG. 8, a first conductive layer 802 is formed over thelower ILD structure 110 and the portion of the interconnect structure108. In some embodiments, a process for forming the first conductivelayer 802 comprises depositing the first conductive layer 802 on thelower ILD structure 110 and the portion of the interconnect structure108. The first conductive layer 802 may be deposited by, for example,CVD, PVD, ALD, sputtering, electrochemical plating, electroless plating,some other deposition process, or a combination of the foregoing. Infurther embodiments, the first conductive layer 802 may comprise, forexample, Cu, Al, TiN, AlCu, some other conductive material, or acombination of the foregoing.

In some embodiments, the first conductive layer 802 comprises multiplelayers. For example, the first conductive layer may comprise a firstlayer (e.g., TiN), a second layer (e.g., AlCu) disposed over and on thefirst layer, and a third layer (e.g., TiN) disposed over and on thesecond layer. In such embodiments, a process for forming the firstconductive layer 802 may comprise depositing the first layer on thelower ILD structure 110 and the portion of the interconnect structure108, the second layer on the first layer, and the third layer on thesecond layer.

As shown in FIG. 9, a second conductive layer 902 is formed over thefirst conductive layer 802. In some embodiments, a process for formingthe second conductive layer 902 comprises depositing the secondconductive layer 902 on the first conductive layer 802. The secondconductive layer 902 may be deposited by, for example, CVD, PVD, ALD,sputtering, electrochemical plating, electroless plating, some otherdeposition process, or a combination of the foregoing. In furtherembodiments, the second conductive layer 902 may comprise, for example,Pt, Ti, Cu, Au, Al, Zn, Sn, Ru, some other conductive material, or acombination of the foregoing.

Also shown in FIG. 9, a first piezoelectric layer 904 is formed over thesecond conductive layer 902. In some embodiments, a process for formingthe first piezoelectric layer 904 comprises depositing the firstpiezoelectric layer 904 on the second conductive layer 902. The firstpiezoelectric layer 904 may be deposited or grown by, for example,sputtering, a spin-on process, CVD, PVD, ALD, molecular-beam epitaxy,some other deposition or growth process, or a combination of theforegoing. In further embodiments, the first piezoelectric layer 904 maycomprise, for example, PZT, ZnO, BaTiO₃, KNbO₃, Na₂WO₃, Ba₂NaNb₅O₅,Pb₂KNb₅O₁₅, La₃Ga₅SiO₁₄, GaPO₄, LiNbO₃, LiTaO₃, some other piezoelectricmaterial, or a combination of the foregoing.

Also shown in FIG. 9, a third conductive layer 906 is formed over thefirst piezoelectric layer 904. In some embodiments, a process forforming the third conductive layer 906 comprises depositing the thirdconductive layer 906 on the first piezoelectric layer 904. The thirdconductive layer 906 may be deposited by, for example, CVD, PVD, ALD,sputtering, electrochemical plating, electroless plating, some otherdeposition process, or a combination of the foregoing. In furtherembodiments, the third conductive layer 906 may comprise, for example,Pt, Ti, Cu, Au, Al, Zn, Sn, Ru, some other conductive material, or acombination of the foregoing. In embodiments in which the dielectricstructures 202 are disposed on the piezoelectric structures 128,respectively, the third conductive layer 906 may not be formed over thefirst piezoelectric layer 904.

As shown in FIG. 10, a first plurality of piezoelectric anti-stictionstructures 124 are formed over the first conductive layer 802. In someembodiments, a process for forming the piezoelectric anti-stictionstructures 124 comprises forming a masking layer (not shown) (e.g., apositive/negative photoresist) on the third conductive layer 906 (see,e.g., FIG. 9). Thereafter, the third conductive layer 906, the firstpiezoelectric layer 904, and the second conductive layer 902 (see, e.g.,FIG. 9) are exposed to an etchant (e.g., a wet/dry etchant). The etchantremoves unmasked portions of the third conductive layer 906, therebyforming a plurality of conductive structures 130 on the firstpiezoelectric layer 904; unmasked portions of the first piezoelectriclayer 904, thereby forming a plurality of piezoelectric structures 128on the second conductive layer 902; and unmasked portions of the secondconductive layer 902, thereby forming a plurality of electrodes 126 onthe first conductive layer 802. Subsequently, the masking layer may bestripped away. It will be appreciated that one or more etchants and/ormasking layers may be utilized to form the piezoelectric anti-stictionstructures 124.

As shown in FIG. 11, an upper conductive line 120 of the interconnectstructure 108 is formed. In some embodiments, a process for forming theupper conductive line 120 comprises forming a masking layer (not shown)on the first conductive layer 802 and covering the piezoelectricanti-stiction structures 124 (see, e.g., FIG. 10). Thereafter, the firstconductive layer 802 is exposed to an etchant. The etchant removesunmasked portions of the first conductive layer 802, thereby forming theupper conductive line 120. Subsequently, the masking layer may bestripped away.

As shown in FIG. 12, an upper ILD layer 1202 is formed over the upperconductive line 120 and over the piezoelectric anti-stiction structures124. The upper ILD layer 1202 may be formed with a substantially planarupper surface. In some embodiments, a process for forming the upper ILDlayer 1202 comprises depositing the upper ILD layer 1202 on the upperconductive line 120 and the piezoelectric anti-stiction structures 124.The upper ILD layer 1202 may be deposited by, for example, CVD, PVD,ALD, sputtering, some other deposition process, or a combination of theforegoing. In further embodiments, a planarization process (e.g., CMP)may be performed into the upper ILD layer 1202 to planarize the uppersurface of the upper ILD layer 1202. The upper ILD layer 1202 maycomprise a low-k dielectric, (e.g., a dielectric material with adielectric constant less than about 3.9), an oxide (e.g., SiO₂), or thelike. It will be appreciated that, in some embodiments, the upper ILDlayer 1202 may comprise one or more stacked ILD layers, which mayrespectively comprise a low-k dielectric, an oxide, or the like.

Also shown in FIG. 12, an upper conductive via 502 is formed in theupper ILD layer 1202. The upper conductive via 502 is formed extendingthrough the upper ILD layer 1202 to the upper conductive line 120. Insome embodiments, a process for forming the upper conductive via 502comprises forming a masking layer (not shown) on the upper ILD layer1202. Thereafter, the upper ILD layer 1202 is exposed to an etchant toremove unmasked portions of the upper ILD layer 1202, thereby forming anopening (not shown) in the upper ILD layer 1202. A conductive layer (notshown) is then deposited on the upper ILD layer 1202 and in the opening.In some embodiments, the conductive layer comprises, for example, Cu,Al, W, or the like. In further embodiments, the conductive layer may bedeposited by, for example, CVD, PVD, ALD, sputtering, electrochemicalplating, electroless plating, some other deposition process, or acombination of the foregoing. Thereafter, a planarization process (e.g.,CMP) is performed into the conductive layer, thereby forming the upperconductive via 502.

As shown in FIG. 13, an upper ILD structure 112 is formed over the lowerILD structure 110. In some embodiments, a process for forming the upperILD structure 112 comprises forming a first opening 1302 in the upperILD layer 1202 that exposes the piezoelectric anti-stiction structures124. In some embodiments, a process for forming the first opening 1302comprises forming a masking layer (not shown) on the upper ILD layer1202 and the upper conductive via 502. Thereafter, the upper ILD layer1202 is exposed to an etchant to remove unmasked portions of the upperILD layer 1202, thereby forming the first opening 1302. In furtherembodiments, formation of the upper ILD structure 112 completesformation of an ILD structure 106.

In embodiments in which the dielectric structures 202 are disposed onthe piezoelectric structures 128, respectively, the dielectricstructures 202 may be formed during or after formation of the upper ILDstructure 112. For example, the dielectric structures 202 may be formedduring formation of the upper ILD structure 112 by selectively formingthe first opening 1302 (e.g., via multiple masking layers and etchprocesses), so that portions of the upper ILD layer 1202 remain on thepiezoelectric structures 128, respectively, as the dielectric structures202. In another example, the dielectric structures 202 may be formedafter formation of the upper ILD structure 112 by depositing adielectric layer onto the exposed piezoelectric structures 128, andselectively etching the dielectric layer to form the dielectricstructures 202 on the piezoelectric structures 128, respectively.

As shown in FIG. 14, a second semiconductor substrate 114 is bonded tothe upper ILD structure 112. In some embodiments, bonding the secondsemiconductor substrate 114 to the upper ILD structure 112 forms a firstlower portion of a cavity 118. In further embodiments, the secondsemiconductor substrate 114 may be bonded to the upper ILD structure 112by, for example, direct bonding, hybrid bonding, eutectic bonding, orsome other boning process. In yet further embodiments, after the secondsemiconductor substrate 114 is bonded to the upper ILD structure 112,the second semiconductor substrate 114 may be thinned down by removing(e.g., via grinding or CMP) an upper portion of the second semiconductorsubstrate 114.

As shown in FIG. 15, a through-substrate via (TSV) 512 is formedextending through the second semiconductor substrate 114 to theinterconnect structure 108. In some embodiments, the TSV 512 is formedextending through the second semiconductor substrate 114, the upper ILDstructure 112, and at least a portion of the lower ILD structure 110.The TSV 512 may be formed extending through an isolation structure 514disposed in the second semiconductor substrate 114. In some embodiments,the isolation structure 514 is formed prior to the TSV 512. In furtherembodiments, the isolation structure 514 may be formed by forming atrench in the second semiconductor substrate 114 and then filling thetrench with a dielectric material. In yet further embodiments, aplanarization process (e.g., CMP) may be performed into the dielectricmaterial.

In some embodiments, a process for forming the TSV 512 comprises forminga masking layer (not shown) on the second semiconductor substrate 114.Thereafter, the second semiconductor substrate 114 is exposed to anetchant that removes unmasked portions of the second semiconductorsubstrate 114 and underlying portions of the upper ILD structure 112 andlower ILD structure 110, thereby forming a TSV opening that extendsthrough the second semiconductor substrate 114 to the interconnectstructure 108. After the TSV opening is formed, a conductive layer (notshown) is deposited on the second semiconductor substrate 114 and in theTSV opening. In some embodiments, the conductive layer comprises, forexample, Cu, Al, W, or the like. In further embodiments, the conductivelayer may be deposited by, for example, CVD, PVD, ALD, sputtering,electrochemical plating, electroless plating, some other depositionprocess, or a combination of the foregoing. Thereafter, a planarizationprocess (e.g., CMP) is performed into the conductive layer, therebyforming the TSV 512. It will be appreciated that, in some embodiments,the TSV 512 may be one of multiple TSVs formed by the above process.

As shown in FIG. 16, a lower bond ring 510 is formed on the secondsemiconductor substrate 114 and the TSV 512. In some embodiments, aprocess for forming the lower bond ring 510 comprises forming a maskinglayer (not shown) over the second semiconductor substrate 114 and theTSV 512. The masking layer comprises a plurality of openings that exposeportions of the second semiconductor substrate 114 and the TSV 512. Aconductive layer (not shown) is then deposited on the masking layer andin the plurality of openings. In some embodiments, the conductive layercomprises, for example, Cu, Al, Au, Sn, some other bonding material, ora combination of the foregoing. In further embodiments, the conductivelayer may be deposited by, for example, CVD, PVD, ALD, sputtering,electrochemical plating, electroless plating, some other depositionprocess, or a combination of the foregoing. Thereafter, a planarizationprocess (e.g., CMP) is performed into the conductive layer, therebyforming the lower bond ring 510. Subsequently, in some embodiments, themasking layer is stripped away.

As shown in FIG. 17, a movable mass 122 is formed in the secondsemiconductor substrate 114. In some embodiments, a process for formingthe movable mass 122 comprises forming a masking layer (not shown) onthe second semiconductor substrate 114 and the lower bond ring 510.Thereafter, the second semiconductor substrate 114 is exposed to anetchant. The etchant removes unmasked portion(s) of the secondsemiconductor substrate 114, thereby forming the movable mass 122.Subsequently, in some embodiments, the masking layer is stripped away.

As shown in FIG. 18, an upper bond ring 508 is formed on a thirdsemiconductor substrate 116. In some embodiments, the upper bond ring508 is formed with a layout that corresponds to a layout of the lowerbond ring 510. In some embodiments, a process for forming the upper bondring 508 comprises forming a masking layer (not shown) over the thirdsemiconductor substrate 116. The masking layer comprises a plurality ofopenings that expose portions of the third semiconductor substrate 116.A conductive layer (not shown) is then deposited on the masking layerand in the plurality of openings. In some embodiments, the conductivelayer comprises, for example, Cu, Al, Au, Sn, some other bondingmaterial, or a combination of the foregoing. In further embodiments, theconductive layer may be deposited by, for example, CVD, PVD, ALD,sputtering, electrochemical plating, electroless plating, some otherdeposition process, or a combination of the foregoing. Thereafter, aplanarization process (e.g., CMP) is performed into the conductivelayer, thereby forming the upper bond ring 508. Subsequently, in someembodiments, the masking layer is stripped away. In yet furtherembodiments, before the upper bond ring 508 is formed, one or more dopedregions may be formed in the third semiconductor substrate 116 (e.g.,via ion implantation).

As shown in FIG. 19, a second opening 1902 is formed in the thirdsemiconductor substrate 116. In some embodiments, a process for formingthe second opening 1902 comprises depositing a first masking layer 1904(e.g., negative/positive photoresist) on the third semiconductorsubstrate 116 and covering the upper bond ring 508. The thirdsemiconductor substrate 116 is then exposed to an etchant. The etchantremoves unmasked portions of the third semiconductor substrate 116,thereby forming the second opening 1902. In some embodiments, the firstmasking layer 1904 may be stripped away.

As shown in FIG. 20, a fourth conductive layer 2002 is formed over thethird semiconductor substrate 116, the upper bond ring 508, and thefirst masking layer 1904. In some embodiments, the fourth conductivelayer 2002 lines the second opening 1902 (see, e.g., FIG. 19). Infurther embodiments, a process for forming the fourth conductive layer2002 comprises depositing the fourth conductive layer 2002 on the thirdsemiconductor substrate 116 and the first masking layer 1904. The fourthconductive layer 2002 may be deposited by, for example, CVD, PVD, ALD,sputtering, electrochemical plating, electroless plating, some otherdeposition process, or a combination of the foregoing. In yet furtherembodiments, the fourth conductive layer 2002 may comprise, for example,Pt, Ti, Cu, Au, Al, Zn, Sn, some other conductive material, or acombination of the foregoing.

Also shown in FIG. 20, a second piezoelectric layer 2004 is formed overthe fourth conductive layer 2002. In some embodiments, a process forforming the second piezoelectric layer 2004 comprises depositing thesecond piezoelectric layer 2004 on the fourth conductive layer 2002. Thesecond piezoelectric layer 2004 may be deposited or grown by, forexample, sputtering, a spin-on process, CVD, PVD, ALD, molecular-beamepitaxy, some other deposition or growth process, or a combination ofthe foregoing. In further embodiments, the second piezoelectric layer2004 may comprise, for example, PZT, ZnO, BaTiO₃, KNbO₃, Na₂WO₃,Ba₂NaNb₅O₅, Pb₂KNb₅O₁₅, La₃Ga₅SiO₁₄, GaPO₄, LiNbO₃, LiTaO₃, some otherpiezoelectric material, or a combination of the foregoing.

Also shown in FIG. 20, a fifth conductive layer 2006 is formed over thesecond piezoelectric layer 2004. In some embodiments, a process forforming the fifth conductive layer 2006 comprises depositing the fifthconductive layer 2006 on the second piezoelectric layer 2004. The fifthconductive layer 2006 may be deposited by, for example, CVD, PVD, ALD,sputtering, electrochemical plating, electroless plating, some otherdeposition process, or a combination of the foregoing. In furtherembodiments, the fifth conductive layer 2006 may comprise, for example,Pt, Ti, Cu, Au, Al, Zn, Sn, some other conductive material, or acombination of the foregoing. In embodiments in which the dielectricstructures 202 are disposed on the piezoelectric structures 128,respectively, the fifth conductive layer 2006 may not be formed over thesecond piezoelectric layer 2004.

As shown in FIG. 21, a second plurality of piezoelectric anti-stictionstructures 124 are formed over the third semiconductor substrate 116. Insome embodiments, the piezoelectric anti-stiction structures 124 areformed within the second opening 1902 (see, e.g., FIG. 19). In someembodiments, a process for forming the piezoelectric anti-stictionstructures 124 comprises forming a second masking layer (not shown) onthe fifth conductive layer 2006 (see, e.g., FIG. 20). Thereafter, thefifth conductive layer 2006, the second piezoelectric layer 2004, andthe fourth conductive layer 2002 (see, e.g., FIG. 20) are exposed to anetchant. The etchant removes unmasked portions of the fifth conductivelayer 2006, thereby forming a plurality of conductive structures 130 onthe second piezoelectric layer 2004; unmasked portions of the secondpiezoelectric layer 2004, thereby forming a plurality of piezoelectricstructures 128 on the fourth conductive layer 2002; and unmaskedportions of the fourth conductive layer 2002, thereby forming aplurality of electrodes 126 on the third semiconductor substrate 116.

As shown in FIG. 22, the third semiconductor substrate 116 is bonded tothe second semiconductor substrate 114, thereby forming an upper portionof the cavity 118. In some embodiments, the cavity 118 is formed as asealed cavity. In further embodiments, a process for bonding the thirdsemiconductor substrate 116 to the second semiconductor substrate 114comprises bonding the upper bond ring 508 to the lower bond ring 510.The upper bond ring 508 may be bonded to the lower bond ring 510 by, forexample, eutectic bonding. It will be appreciated that the thirdsemiconductor substrate 116 may be bonded to the second semiconductorsubstrate 114 via other bonding processes (e.g., direct bonding, hybridbonding, etc.). In yet further embodiments, after the thirdsemiconductor substrate 116 is bonded to the second semiconductorsubstrate 114, formation of the MEMS device 100 is complete.

FIG. 23 illustrates a flowchart 2300 of some embodiments of a method forforming a MEMS device comprising a piezoelectric anti-stictionstructure. While the flowchart 2300 of FIG. 23 is illustrated anddescribed herein as a series of acts or events, it will be appreciatedthat the illustrated ordering of such acts or events is not to beinterpreted in a limiting sense. For example, some acts may occur indifferent orders and/or concurrently with other acts or events apartfrom those illustrated and/or described herein. Further, not allillustrated acts may be required to implement one or more aspects orembodiments of the description herein, and one or more of the actsdepicted herein may be carried out in one or more separate acts and/orphases.

At act 2302, a first semiconductor substrate is provided having a lowerinterlayer dielectric (ILD) structure disposed on the firstsemiconductor substrate. FIG. 7 illustrates a cross-sectional view ofsome embodiments corresponding to act 2302.

At act 2304, a plurality of piezoelectric anti-stiction structures areformed over the lower ILD structure and the first semiconductorsubstrate. FIGS. 8-10 illustrate a series of cross-sectional views ofsome embodiments corresponding to act 2304.

At act 2306, an upper ILD structure is formed over the lower ILDstructure and the first semiconductor substrate, wherein thepiezoelectric anti-stiction structures are disposed in an opening of theupper ILD structure. FIGS. 11-13 illustrate a series of cross-sectionalviews of some embodiments corresponding to act 2306.

At act 2308, a second semiconductor substrate is bonded to the upper ILDstructure, wherein the second semiconductor substrate extends across theopening to form a cavity, and wherein the piezoelectric anti-stictionstructures are disposed in the cavity. FIG. 14 illustrates across-sectional view of some embodiments corresponding to act 2308.

At act 2310, a movable mass is formed in the second semiconductorsubstrate and over the piezoelectric anti-stiction structures. FIGS.15-17 illustrate a series of cross-sectional views of some embodimentscorresponding to act 2310.

At act 2312, a third semiconductor substrate is bonded to the secondsemiconductor substrate. FIGS. 18-22 illustrate a series ofcross-sectional views of some embodiments corresponding to act 2312.

In some embodiments, the present application provides amicroelectromechanical system (MEMS) device. The MEMS device comprises afirst dielectric structure disposed over a first semiconductorsubstrate, wherein the first dielectric structure at least partiallydefines a cavity. A second semiconductor substrate is disposed over thefirst dielectric structure and comprises a movable mass, whereinopposite sidewalls of the movable mass are disposed between oppositesidewall of the cavity. A first piezoelectric anti-stiction structure isdisposed between the movable mass and the first dielectric structure,wherein the first piezoelectric anti-stiction structure comprises afirst piezoelectric structure and a first electrode disposed between thefirst piezoelectric structure and the first dielectric structure.

In some embodiments, the present application provides an integrated chip(IC). The IC comprises a microelectromechanical system (MEMS). The MEMScomprises: a semiconductor substrate; a movable mass spaced from thesemiconductor; a cavity at least partially disposed between thesemiconductor substrate and the movable mass, wherein opposite sidewallsof the movable mass are disposed between opposite sidewalls of thecavity; and a piezoelectric anti-stiction structure disposed on asurface of the cavity, wherein the piezoelectric anti-stiction structurecomprises a piezoelectric structure and an electrode. Bias circuitry iselectrically coupled to the electrode, wherein the bias circuitry isconfigured to provide a first voltage to the electrode.

In some embodiments, the present application provides a method forforming a microelectromechanical system (MEMS) device. The methodcomprises forming a first conductive layer on a lower interlayerdielectric (ILD) structure, wherein the lower ILD structure is disposedover a semiconductor substrate. A first conductive layer is formed onthe lower ILD. A second conductive layer is formed on the firstconductive layer. A piezoelectric layer is formed on the secondconductive layer. The first piezoelectric layer and the secondconductive layer are etched to form a piezoelectric structure and anelectrode, respectively, wherein the piezoelectric structure is disposedon the electrode. The first conductive layer is etched to form theconductive line. An upper ILD structure is formed over the lower ILDstructure, the conductive line, the electrode, and the piezoelectricstructure. An opening is formed in the upper ILD structure that exposesthe piezoelectric structure. A movable mass is formed over the upper ILDstructure, wherein the movable mass is formed having opposite sidewallsdisposed between opposite sidewalls of the opening.

The foregoing outlines features of several embodiments so that thoseskilled in the art may better understand the aspects of the presentdisclosure. Those skilled in the art should appreciate that they mayreadily use the present disclosure as a basis for designing or modifyingother processes and structures for carrying out the same purposes and/orachieving the same advantages of the embodiments introduced herein.Those skilled in the art should also realize that such equivalentconstructions do not depart from the spirit and scope of the presentdisclosure, and that they may make various changes, substitutions, andalterations herein without departing from the spirit and scope of thepresent disclosure.

What is claimed is:
 1. A method for forming a microelectromechanicalsystem (MEMS) device, the method comprising: forming a first conductivelayer over a lower interlayer dielectric (ILD) structure, wherein thelower ILD structure is disposed over a first semiconductor substrate;forming a first piezoelectric layer over the first conductive layer;etching the first piezoelectric layer and the first conductive layer toform a first piezoelectric structure and a first electrode,respectively; forming an upper ILD structure over the lower ILDstructure, the first electrode, and the first piezoelectric structure;forming an opening in the upper ILD structure that exposes the firstpiezoelectric structure; and forming a movable mass over the upper ILDstructure, wherein the movable mass is formed having opposite sidewallsdisposed between opposite sidewalls of the opening.
 2. The method ofclaim 1, further comprising: before the first piezoelectric layer or thefirst conductive layer is etched, forming a second conductive layer onthe first piezoelectric layer; and etching the second conductive layerto form a first conductive structure, wherein the first conductivestructure is disposed on the first piezoelectric structure and spacedfrom the first electrode by the first piezoelectric structure.
 3. Themethod of claim 1, further comprising: before the first conductive layeris formed, forming a third conductive layer over the lower ILDstructure, wherein the first conductive layer is formed over the thirdconductive layer; and etching the third conductive layer to form aconductive line, wherein the upper ILD structure is formed over theconductive line.
 4. The method of claim 3, wherein forming the openingin the upper ILD structure exposes the conductive line.
 5. The method ofclaim 1, wherein forming the movable mass comprises: bonding a secondsemiconductor substrate to the upper ILD structure; and etching thesecond semiconductor substrate to form the movable mass.
 6. The methodof claim 5, further comprising: before the second semiconductorsubstrate is bonded to the upper ILD structure, forming an upperconductive via in the upper ILD structure, wherein the upper conductivevia electrically couples the movable mass to an interconnect structuredisposed in the lower ILD structure.
 7. The method of claim 6, furthercomprising: forming an isolation structure in the second semiconductorsubstrate; forming a through-substrate via (TSV) that extends verticallythrough the isolation structure, the second semiconductor substrate, andthe upper ILD structure; forming a second electrode on a thirdsemiconductor substrate; forming a second piezoelectric structure on thesecond electrode; and bonding the third semiconductor substrate to thesecond semiconductor substrate so that the movable mass is disposedvertically between the first piezoelectric structure and the secondpiezoelectric structure, wherein bonding the third semiconductorsubstrate to the second semiconductor substrate electrically couples thesecond electrode to the TSV.
 8. The method of claim 7, wherein bondingthe third semiconductor substrate to the second semiconductor substratecomprises: forming a lower bond ring on the second semiconductorsubstrate; forming an upper bond ring on the third semiconductorsubstrate; and bonding the upper bond ring to the lower bond ring. 9.The method of claim 8, wherein the lower bond ring is formed over theTSV and the isolation structure, and wherein the lower bond ring and theupper bond ring at least partially define a conductive path that extendsbetween the second electrode and the TSV.
 10. An integrated chip (IC),comprising: a microelectromechanical system (MEMS) comprising: asemiconductor substrate; a movable mass spaced from the semiconductorsubstrate; a cavity at least partially disposed between thesemiconductor substrate and the movable mass, wherein opposite sidewallsof the movable mass are disposed between opposite sidewalls of thecavity; and a first piezoelectric anti-stiction structure disposed on afirst surface of the cavity, wherein the first piezoelectricanti-stiction structure comprises a first piezoelectric structure and afirst electrode; and bias circuitry electrically coupled to the firstelectrode, wherein the bias circuitry is configured to provide a firstvoltage to the first electrode.
 11. The IC of claim 10, furthercomprising: a doped region disposed in the movable mass, wherein thebias circuitry is electrically coupled to the doped region andconfigured to provide a second voltage to the doped region.
 12. The ICof claim 11, wherein the second voltage is different than the firstvoltage.
 13. The IC of claim 10, further comprising: measurementcircuitry electrically coupled to the MEMS and configured to determinewhether the movable mass is in either a movable state or a seized state,wherein the bias circuitry provides the first voltage to the firstelectrode when the movable mass is in the seized state.
 14. The IC ofclaim 13, wherein the bias circuitry does not provide the first voltageto the first electrode when the movable mass is in the movable state.15. The IC of claim 10, wherein the MEMS further comprises: a secondpiezoelectric anti-stiction structure disposed on a second surface ofthe cavity, wherein the second piezoelectric anti-stiction structurecomprises a second piezoelectric structure and a second electrode,wherein the movable mass is disposed vertically between the secondpiezoelectric anti-stiction structure and the first piezoelectricanti-stiction structure.
 16. The IC of claim 15, further comprising:measurement circuitry electrically coupled to the MEMS and configured todetermine whether the movable mass is in either a movable state, a firstseized state, or a second seized state, wherein: the movable masscontacts the first piezoelectric anti-stiction structure and is spacedfrom the second piezoelectric anti-stiction structure in the firstseized state; the movable mass contacts the second piezoelectricanti-stiction structure and is spaced from the first piezoelectricanti-stiction structure in the second seized state; the bias circuitryprovides the first voltage to the first electrode when the movable massis in the first seized state; and the bias circuitry provides a secondvoltage to the second electrode when the movable mass is in the secondseized state.
 17. An integrated chip (IC), comprising: amicroelectromechanical system (MEMS) comprising: a semiconductorsubstrate; a movable mass spaced from the semiconductor substrate; acavity at least partially disposed between the semiconductor substrateand the movable mass, wherein opposite sidewalls of the movable mass aredisposed between opposite sidewalls of the cavity; a first piezoelectricanti-stiction structure disposed on a surface of the cavity, wherein thefirst piezoelectric anti-stiction structure comprises a firstpiezoelectric structure and a first electrode; and a secondpiezoelectric anti-stiction structure disposed on the surface of thecavity, wherein the second piezoelectric anti-stiction structurecomprises a second piezoelectric structure and a second electrode;measurement circuitry configured to determine whether the movable massis in either a first seized state, a second seized state, or a thirdseized state, wherein the movable mass contacts both the firstpiezoelectric anti-stiction structure and the second piezoelectricanti-stiction structure in the first seized state, wherein the movablemass contacts the first piezoelectric anti-stiction structure and isspaced from the second piezoelectric anti-stiction structure in thesecond seized state, and wherein the movable mass contacts the secondpiezoelectric anti-stiction structure and is spaced from the firstpiezoelectric anti-stiction structure in the third seized state; andbias circuitry electrically coupled to the first electrode and thesecond electrode, wherein the bias circuitry is configured to providebias signals to the first electrode and the second electrode based onwhether the movable mass is in the first seized state, the second seizedstate, or the third seized state.
 18. The IC of claim 17, wherein whenthe measurement circuitry determines the movable mass is in the firstseized state: the bias circuitry provides a first bias signal to thefirst electrode to deform the first piezoelectric structure; and thebias circuitry provides a second bias signal to the second electrode todeform the second piezoelectric structure.
 19. The IC of claim 17,wherein: when the measurement circuitry determines the movable mass isin the second seized state, the bias circuitry provides a first biassignal to the first electrode to deform the first piezoelectricstructure; and when the measurement circuitry determines the movablemass is in the third seized state, the bias circuitry provides a secondbias signal to the second electrode to deform the second piezoelectricstructure.
 20. The IC of claim 17, wherein: when the measurementcircuitry determines the movable mass is in the first seized state: thebias circuitry provides a first bias signal to the first electrode todeform the first piezoelectric structure; and the bias circuitryprovides a second bias signal to the second electrode to deform thesecond piezoelectric structure; when the measurement circuitrydetermines the movable mass is in the second seized state, the biascircuitry provides the first bias signal to the first electrode todeform the first piezoelectric structure and the bias circuitry does notprovide the second bias signal to the second electrode; and when themeasurement circuitry determines the movable mass is in the third seizedstate, the bias circuitry provides the second bias signal to the secondelectrode to deform the second piezoelectric structure and the biascircuitry does not provide the first bias signal to the first electrode.